Built-in self-test for folded bit-line Mbit DRAMs. - Emil Gizdarski (Integr., 1996)

Spirit: satisfiability problem implementation for redundancy identification and test generation. - Emil Gizdarski; Hideo Fujiwara (Asian Test Symposium, 2000)

A class of sequential circuits with combinational test generation complexity under single-fault assumption. - Michiko Inoue; Emil Gizdarski; Hideo Fujiwara (Asian Test Symposium, 2000)

Detection of Delay Faults in Memory Address Decoders. - Emil Gizdarski (J. Electron. Test., 2000)

A Framework for Low Complexity Static Learning. - Emil Gizdarski; Hideo Fujiwara (DAC, 2001)

Fault Set Partition for Efficient Width Compression. - Emil Gizdarski; Hideo Fujiwara (Asian Test Symposium, 2002)

Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption. - Michiko Inoue; Emil Gizdarski; Hideo Fujiwara (J. Electron. Test., 2002)

SPIRIT: a highly robust combinational test generation algorithm. - Emil Gizdarski; Hideo Fujiwara (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

A Reconfigurable Shared Scan-in Architecture. - Samitha Samaranayake; Emil Gizdarski; Nodari Sitchinava; Frederic Neuveux; Rohit Kapur; Thomas W. Williams (VTS, 2003)

Yield Analysis of Logic Circuits. - Davide Appello; Alessandra Fudoli; Katia Giarda; Emil Gizdarski; Ben Mathew; Vincenzo Tancorre (VTS, 2004)

Changing the Scan Enable during Shift. - Nodari Sitchinava; Samitha Samaranayake; Rohit Kapur; Emil Gizdarski; Frederic Neuveux; Thomas W. Williams (VTS, 2004)

Understanding Yield Losses in Logic Circuits. - Davide Appello; Alessandra Fudoli; Katia Giarda; Vincenzo Tancorre; Emil Gizdarski; Ben Mathew (IEEE Des. Test Comput., 2004)

Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST. - Peter Wohl; John A. Waicukauski; Sanjay Patel; Cy Hay; Emil Gizdarski; Ben Mathew (VTS, 2005)

Minimizing the Impact of Scan Compression. - Peter Wohl; John A. Waicukauski; Rohit Kapur; Sanjay Ramnath; Emil Gizdarski; Thomas W. Williams; P. Jaini (VTS, 2007)

Constructing Augmented Multimode Compactors. - Emil Gizdarski (VTS, 2008)

Fully X-tolerant, very high scan compression. - Peter Wohl; John A. Waicukauski; Frederic Neuveux; Emil Gizdarski (DAC, 2010)

Constructing augmented time compactors. - Emil Gizdarski (ETS, 2010)

Construction and Analysis of Augmented Time Compactors. - Emil Gizdarski (J. Electron. Test., 2011)

Two-Step Dynamic Encoding for Linear Decompressors. - Emil Gizdarski (ATS, 2014)

A shared memory based parallel diagnosis system. - Xiaolei Cai; Emil Gizdarski; Dan Landau (VTS, 2014)

A New Paradigm for Synthesis of Linear Decompressors. - Emil Gizdarski; Peter Wohl; John A. Waicukauski (DAC, 2017)