Pre-Silicon Yield Estimation using Machine Learning Regression. - Elena-Diana Sandru; Emilian David; Georg Pelz (ICECS, 2019)

Modeling the Dependencies between Circuit and Technology Parameters for Sensitivity Analysis using Machine Learning Techniques. - Elena-Diana Sandru; Corneliu Burileanu; Emilian David; Andi Buzo; Georg Pelz (SMACD, 2019)

On the Pole-Placement Technique for the Design of a DC-DC Buck Converter Discrete PID Control. - Vasilica-Daniela Andries; Liviu Goras; Emilian David; Andi Buzo; Georg Pelz (DDECS, 2020)

A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification. - Andrei Gaita; Georgian Nicolae; Emilian C. David; Andi Buzo; Corneliu Burileanu; Georg Pelz (ETS, 2020)

Machine Learning-Based Local Sensitivity Analysis of Integrated Circuits to Process Variations. - Elena-Diana Sandru; Emilian David; Georg Pelz (ICECS, 2020)

Modeling the Dependency of Analog Circuit Performance Parameters on Manufacturing Process Variations With Applications in Sensitivity Analysis and Yield Prediction. - Elena-Diana Sandru; Emilian David; Ingrid Kovacs; Andi Buzo; Corneliu Burileanu; Georg Pelz (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

On Approaching Multivariate IC Pre-silicon Verification Using ML-based Adaptive Algorithms. - Alecsandra Rusu; Emilian David; Marina Dana Topa; Vasile Grosu; Andi Buzo; Georg Pelz (IOLTS, 2024)

Multiple Output Modelling of Integrated Circuits Behavior Using an Active Learning Approach. - Vasile Grosu; Emilian David; Liviu Goras; Georg Pelz (SMACD, 2024)

Frontend-Backend Integrated Circuit Device Linking Using Machine Learning Algorithms. - Ingrid Kovacs; Bianca Carbunescu-Stoenescu; Marina Dana Topa; Andi Buzo; Emilian David; Georg Pelz (SMACD, 2024)

On Multivariate Electrical Performance Machine Learning Driven Pre-Silicon IC Adaptive Verification. - Alecsandra Rusu; Emilian David; Vasile Grosu; Marina Dana Topa; Andi Buzo; Bianca Carbunescu; Georg Pelz (IEEE Access, 2024)