Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. - Emilie Deloffre; L. Montès; Gérard Ghibaudo; Sylvie Bruyère; Serge Blonkowski; Stéphane Bécu; Mickael Gros-Jean; Sébastien Crémer (Microelectron. Reliab., 2005)

Use of optical metrology for wafer level packaging of CMOS image sensor. - D. Le Cunff; A. Pravdivtsev; K. Le Chao; C. Euvrard; Emilie Deloffre; A. Cailean (3DIC, 2010)

Impact of containment and deposition method on sub-micron chip-to-wafer self-assembly yield. - Sebastien Mermoz; Loic Sanchez; Léa Di Cioccio; Jean Berthier; Emilie Deloffre; Christian Fretigny (3DIC, 2011)