Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction. - M. Verchiani; Emilien Bouyssou; Guillaume Fiannaca; F. Cantin; Christine Anceau; Pierre Ranson (Microelectron. Reliab., 2008)

Percolation theory applied to PZT thin films capacitors breakdown mechanisms. - Mohamed-Tahar Chentir; J.-B. Jullien; B. Valtchanov; Emilien Bouyssou; Laurent Ventura; Christine Anceau (Microelectron. Reliab., 2009)

Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD). - Marianne Diatta; Emilien Bouyssou; David Trémouilles; P. Martinez; F. Roqueta; O. Ory; Marise Bafleur (Microelectron. Reliab., 2009)