Reliability prediction with MTOL. - Joseph B. Bernstein; Alain Bensoussan 002; Emmanuel Bender (Microelectron. Reliab., 2017)

Microchip Health Monitoring System Using the FLL Circuit. - Emmanuel Bender; Joseph B. Bernstein (Sensors, 2021)

The Effects of Process Variations and BTI in Packaged FinFET Devices. - Emmanuel Bender; Joseph B. Bernstein; Duane S. Boning (IRPS, 2023)

The Correct Hot Carrier Degradation Model. - Joseph B. Bernstein; Emmanuel Bender; Alain Bensoussan 002 (IRPS, 2023)