Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations. - Emmanuel Marcault; Marie Breil; A. Bourennane; Patrick Tounsi; Jean-Marie Dorkel (Microelectron. Reliab., 2012)

Distributed electrothermal modeling methodology for MOS gated power devices simulations. - Emmanuel Marcault; Jean-Luc Massol; Patrick Tounsi; Jean-Marie Dorkel (MIXDES, 2013)