A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. - Emmanuel Rondey; Yann Tellier; Simone Borri (IOLTW, 2002)

A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. - Emmanuel Rondey; Yann Tellier; Simone Borri (MTDT, 2002)