Differential Thermal Testing: An Approach to its Feasibility. - Josep Altet; Antonio Rubio 001; Wilfrid Claeys; Stefan Dilhaire; Emmanuel Schaub; Hideo Tamamoto (J. Electron. Test., 1999)

Thermal Testing: Fault Location Strategies. - Josep Altet; Antonio Rubio 001; Emmanuel Schaub; Stefan Dilhaire; Wilfrid Claeys (VTS, 2000)

Thermal coupling in integrated circuits: application to thermal testing. - Josep Altet; Antonio Rubio 001; Emmanuel Schaub; Stefan Dilhaire; Wilfrid Claeys (IEEE J. Solid State Circuits, 2001)

Laser diode COFD analysis by thermoreflectance microscopy. - Stefan Dilhaire; Stéphane Grauby; Sébastien Jorez; Luis David Patiño Lopez; Emmanuel Schaub; Wilfrid Claeys (Microelectron. Reliab., 2001)