Bias Temperature Instability on SiC n- and p-MOSFETs for High Temperature CMOS Applications. - Emran K. Ashik; Sundar Babu Isukapati; Hua Zhang; Tianshi Liu; Utsav Gupta; Adam J. Morgan; Veena Misra; Woongje Sung; Ayman A. Fayed; Anant K. Agarwal; Bongmook Lee (IRPS, 2022)

A 600V Half-Bridge Power Stage Fully Integrated with 25V Gate-Drivers in SiC CMOS Technology. - Hua Zhang; Tianshi Liu; Utsav Gupta; Sundar Babu Isukapati; Emran K. Ashik; Adam J. Morgan; Bongmook Lee; Woongje Sung; Anant K. Agarwal; Ayman A. Fayed (MWSCAS, 2022)