Performance Evaluation of the Body-Diode of SiC Mosfets under Repetitive Surge Current Operation. - Thiago Batista Soeiro; Elena Mengotti; Enea Bianda; Gabriel Ortiz (IECON, 2019)

Power Cycling Reliability of SiC MOSFETs in Discrete and Module Packages. - Ivana Kovacevic-Badstuebner; Salvatore Race; Thomas Ziemann; Shweta Tiwari; Ulrike Grossner; Elena Mengotti; Enea Bianda; Joni P. A. Jormanainen (IRPS, 2022)

Extended Analysis of Power Cycling Behavior of TO-Packaged SiC Power MOSFETs. - Ivana Kovacevic-Badstuebner; Salvatore Race; Ulrike Grossner; Elena Mengotti; Christoph Kenel; Enea Bianda; Joni P. A. Jormanainen (IRPS, 2023)

Industrial approach to the chip and package reliability of SiC MOSFETs (Invited). - Elena Mengotti; Enea Bianda; David Baumann; Gerd Schlottig; Francisco Canales (IRPS, 2023)

Application of Cumulative Exposure Model for the Step-Up Voltage Tests of MOSFET Devices. - Roman Mukin; Elena Mengotti; Enea Bianda; Kai Hencken (ICSRS, 2024)