Voltage stress-induced performance degradation in NMOSFET mixer. - Chuanzhao Yu; Hong Yang; Enjun Xiao; J. S. Yuan (IEICE Electron. Express, 2005)

Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications. - Enjun Xiao; P. P. Ghosh; Chuanzhao Yu; J. S. Yuan (Microelectron. Reliab., 2005)

Voltage stress-induced hot carrier effects on SiGe HBT VCO. - Chuanzhao Yu; Enjun Xiao; J. S. Yuan (Microelectron. Reliab., 2005)

Dynamic voltage stress effects on nMOS varactor. - Chuanzhao Yu; J. S. Yuan; Enjun Xiao (Microelectron. Reliab., 2006)