Discrete and continuous substrate noise spectrum dependence on digital circuit characteristics. - Enrique Barajas; Luis Elvira; Miguel A. Méndez; Ferran Martorell; Diego Mateo; José Luis González 001 (ISCAS (5), 2005)

Characterization and noise analysis of a 12-bit current steering digital-to-analog converter. - Tomás Lahoz; Enrique Barajas; José Luis González 001 (ISCAS (1), 2005)

Interactive presentation: Behavioral modeling of delay-locked loops and its application to jitter optimization in ultra wide-band impulse radio systems. - Enrique Barajas; R. Cosculluela; D. Coutinho; Diego Mateo; José Luis González 001; I. Cairò; S. Banda; M. Ikeda (DATE, 2007)

Behavioural Modelling of DLLs for Fast Simulation and Optimisation of Jitter and Power Consumption. - Enrique Barajas; Diego Mateo; José Luis González 001 (DSD, 2010)

Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches. - Peyman Pouyan; Esteve Amat; Enrique Barajas; Antonio Rubio 001 (ISQED, 2014)

A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging. - Javier Diaz-Fortuny; Javier Martín-Martínez; Rosana Rodríguez; Montserrat Nafría; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001; Enrique Barajas; Xavier Aragonès; Diego Mateo (SMACD, 2017)

Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology. - Enrique Barajas; Xavier Aragonès; Diego Mateo; Francesc Moll; Antonio Rubio 001; Javier Martín-Martínez; Rosana Rodríguez; Marc Porti; Montserrat Nafría; Rafael Castro-López; Elisenda Roca; Francisco V. Fernández 001 (PATMOS, 2018)

On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits. - Anant Rungta; Josep Altet; Enrique Barajas; Antonio Rubio 001; Xavier Aragonès; Diego Mateo (DCIS, 2019)

Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling. - Xavier Aragonès; Diego Mateo; Enrique Barajas; Albert Crespo-Yepes; Rosana Rodríguez; Javier Martín-Martínez; Montserrat Nafría (ISCAS, 2019)

A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI. - Javier Diaz-Fortuny; Javier Martín-Martínez; Rosana Rodríguez; Rafael Castro-López; Elisenda Roca; Xavier Aragonès; Enrique Barajas; Diego Mateo; Francisco V. Fernández 001; Montserrat Nafría (IEEE J. Solid State Circuits, 2019)

Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology. - Enrique Barajas; Xavier Aragonès; Diego Mateo; Josep Altet (Sensors, 2019)

Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. - Xavier Perpiñà; Ferran Reverter; Javier Leon; Enrique Barajas; Miquel Vellvehí; Xavier Jordà; Josep Altet (IEEE Trans. Instrum. Meas., 2019)

Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. - Rosana Rodríguez; Albert Crespo-Yepes; Javier Martín-Martínez; Montserrat Nafría; Xavier Aragonès; Diego Mateo; Enrique Barajas (IRPS, 2020)

BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits. - Josep Altet; Enrique Barajas; Diego Mateo; Alexandre Billong; Xavier Aragonès; Xavier Perpiñà; Ferran Reverter (Sensors, 2021)

Potential of functional analysis applied to Sentinel-2 time-series to assess relevant agronomic parameters at the within-field level in viticulture. - Sergio Vélez; Florian Rançon; Enrique Barajas; Guilhem Brunel; José Antonio Rubio; Bruno Tisseyre (Comput. Electron. Agric., 2022)

Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements. - Josep Altet; Xavier Aragonès; Enrique Barajas; Xavier Gisbert; Sergio Martínez; Diego Mateo (Sensors, 2023)