Low temperature SnO2 films deposited by APCVD. - Crisóforo Morales; Héctor Juárez; Tomás Díaz; Yasuhiro Matsumoto; Enrique Rosendo; Godofredo Garcia; M. Rubin; F. Mora; Mauricio Pacio; A. García (Microelectron. J., 2008)

Fabrication, characterization, and analysis of photodetectors metal-porous silicon with different geometry and thickness of the porous silicon layer. - Godofredo García Salgado; R. Hernández; Javier Martínez; Tomás Díaz; Héctor Juárez; Enrique Rosendo; Reina Galeazzi; A. García; Gabriel Juárez (Microelectron. J., 2008)

Porous Silicon Gas Sensors: The Role of the Layer Thickness and the Silicon Conductivity. - Francisco Ramírez-González; Godofredo García Salgado; Enrique Rosendo; Tomás Díaz; Fabiola Nieto-Caballero; Antonio Coyopol; Román Romano; Alberto Luna 001; Karim Monfil; Erick Gastellou (Sensors, 2020)