Multi-level forming-free HfO2-based ReRAM for energy-efficient computing. - Erbing Hua; Heba Abunahla; Georgi Gaydadjiev; Said Hamdioui; Ryoichi Ishihara (DRC, 2024)

Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. - Hanzhi Xun; Moritz Fieback; Mohammad Amin Yaldagard; Sicong Yuan; Erbing Hua; Hassen Aziza; Mottaqiallah Taouil; Said Hamdioui (ITC, 2024)

In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Changhao Wang; Erbing Hua; Hassen Aziza; Leticia Bolzani Poehls; Riccardo Cantoro; Rajendra Bishnoi; Mottaqiallah Taouil; Said Hamdioui (ETS, 2025)