A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise. - Erdem Serkan Erdogan; Sule Ozev (ITC, 2006)

An ADC-BiST scheme using sequential code analysis. - Erdem Serkan Erdogan; Sule Ozev (DATE, 2007)

Diagnosis of assembly failures for System-in-Package RF tuners. - Erdem Serkan Erdogan; Sule Ozev; Philippe Cauvet (ISCAS, 2008)

Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers. - Erdem Serkan Erdogan; Sule Ozev (VTS, 2008)

A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources. - Erdem Serkan Erdogan; Sule Ozev (VTS, 2009)

Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST. - Erdem Serkan Erdogan; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2010)

A Multi-Site Test Solution for Quadrature Modulation RF Transceivers. - Erdem Serkan Erdogan; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)