Analytical modeling of dual-gate HFET's. - Wei Long; Li-heng Lee; Erhard Kohn; Ken K. Chin (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997)

The Diamond Ink Jet. - Eberhard P. Hofer; Stefan aus der Wiesche; Christian Rembe; Joachim Patzer; Peter Gluche; Rüdiger Leuner; Erhard Kohn (Electronic Imaging, 1998)

3D Chip Stack Technology Using Through-Chip Interconnects. - Peter Benkart; Alexander Kaiser 002; Andreas Munding; Markus Bschorr; Hans-Jörg Pfleiderer; Erhard Kohn; Arne Heittmann; Holger Huebner; Ulrich Ramacher (IEEE Des. Test Comput., 2005)

Reliability investigation of the degradation of the surface passivation of InAlN/GaN HEMTs using a dual gate structure. - Clemens Ostermaier; Peter Lagger; Mohammed Alomari; Patrick Herfurth; David Maier 002; Alexander Alexewicz; Marie-Antoinette di Forte-Poisson; Sylvain L. Delage; Gottfried Strasser; Dionyz Pogany; Erhard Kohn (Microelectron. Reliab., 2012)

Al0.85Ga0.15N/Al0.6Ga0.4N High Electron Mobility Transistors on Native AlN Substrates with >9 MV/cm Mesa Breakdown Fields. - Dolar Khachariya; Seiji Mita; Pramod Reddy; Saroj Dangi; Pegah Bagheri; M. Hayden Breckenridge; Rohan Sengupta; Erhard Kohn; Zlatko Sitar; Ramon Collazo; Spyridon Pavlidis (DRC, 2021)