Interconnect thermal modeling for determining design limits on current density. - Danqing Chen; Erhong Li; Elyse Rosenbaum; Sung-Mo Kang (ISPD, 1999)

Predicting CMOS Hot Carrier Degradation in VLSI Circuits - Erhong Li (1999)

Interconnect thermal modeling for accurate simulation of circuittiming and reliability. - Danqing Chen; Erhong Li; Elyse Rosenbaum; Sung-Mo Kang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000)