A Generic Method to Develop a Defect Monitoring System for IC Processes. - Eric Bruls; F. Camerik; H. J. Kretschman; Jochen A. G. Jess (ITC, 1991)

Bridging Defects Resistance Measurements in a CMOS Process. - Rosa Rodríguez-Montañés; Joan Figueras; Eric Bruls (ITC, 1992)

Parameter Monitoring: Advantages and Pitfalls. - M. M. A. van Rosmalen; Keith Baker; Eric Bruls; Jochen A. G. Jess (ITC, 1993)

Comments on 'Totally self-checking CMOS circuit design for breaks and stuck-on faults'. - Eric Bruls; Manoj Sachdev; Keith Baker (IEEE J. Solid State Circuits, 1993)

Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits. - Eric Bruls (ITC, 1994)

Analogue Fault Simulation Based on Layout-Dependent Fault Models. - R. J. A. Harvey; Andrew Mark David Richardson; Eric Bruls; Keith Baker (ITC, 1994)

Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. - Marly Roncken; Eric Bruls (ITC, 1996)

Bridging defects resistance in the metal layer of a CMOS process. - Rosa Rodríguez-Montañés; E. M. J. G. Bruls; Joan Figueras (J. Electron. Test., 1996)

Built-in self-test methodology for A/D converters. - R. de Vries; Taco Zwemstra; E. M. J. G. Bruls; Paul P. L. Regtien (ED&TC, 1997)