Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. - Cezary Sydlo; Bastian Mottet; Husin Ganis; Hans L. Hartnagel; Viktor Krozer; Sylvain L. Delage; Simone Cassette; Eric Chartier; D. Floriot; Steven Bland (Microelectron. Reliab., 2001)

Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes. - Mourad Oualli; Christian Dua; O. Patard; P. Altuntas; S. Piotrowicz; Piero Gamarra; Cedric Lacam; J.-C. Jacquet; L. Teisseire; D. Lancereau; Eric Chartier; C. Potier; et al. (Microelectron. Reliab., 2018)