A Hybrid Flow for Memory Failure Bitmap Classification. - Jianbo Li; Yu Huang 005; Wu-Tung Cheng; Chris Schuermyer; Dong Xiang; Eric Faehn; Ruth Farrugia (Asian Test Symposium, 2012)

An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs. - Tien-Phu Ho; Eric Faehn; Arnaud Virazel; Alberto Bosio; Patrick Girard 001 (ITC, 2018)

Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip. - Safa Mhamdi; Arnaud Virazel; Patrick Girard 001; Alberto Bosio; Etienne Auvray; Eric Faehn; Aymen Ladhar (IOLTS, 2019)

Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP. - Antonios Pavlidis; Marie-Minerve Louërat; Eric Faehn; Anand Kumar; Haralampos-G. D. Stratigopoulos (DATE, 2020)

BIST-Assisted Analog Fault Diagnosis. - Antonios Pavlidis; Eric Faehn; Marie-Minerve Louërat; Haralampos-G. Stratigopoulos (ETS, 2021)

SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety. - Antonios Pavlidis; Marie-Minerve Louërat; Eric Faehn; Anand Kumar; Haralampos-G. Stratigopoulos (IEEE Trans. Circuits Syst. I Regul. Pap., 2021)

Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure. - Michele Portolan; Antonios Pavlidis; Giorgio Di Natale; Eric Faehn; Haralampos-G. Stratigopoulos (ITC, 2022)

Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs. - Antonios Pavlidis; Eric Faehn; Marie-Minerve Louërat; Haralampos-G. Stratigopoulos (VTS, 2022)

On Using Cell-Aware Methodology for SRAM Bit Cell Testing. - Xhesila Xhafa; Aymen Ladhar; Eric Faehn; Lorena Anghel; Gregory di Pendina; Patrick Girard 001; Arnaud Virazel (ETS, 2023)

A Structural Testing Approach for SRAM Address Decoders Using Cell-Aware Methodology. - Xhesila Xhafa; Eric Faehn; Patrick Girard 001; Arnaud Virazel (DFT, 2024)

Producing a Bidirectional ATPG Compliant Verilog-HDL Memory Model of SRAM. - D. Ronga; Xhesila Xhafa; Eric Faehn; Patrick Girard 001; Thibault Vayssade; Arnaud Virazel (DTTIS, 2024)

A Graph-Based Methodology for Speeding up Cell-Aware Model Generation. - Gianmarco Mongelli; Xhesila Xhafa; Eric Faehn; Dylan Robins; Patrick Girard 001; Arnaud Virazel (IOLTS, 2024)

A Fast and Efficient Graph-Based Methodology for Cell-Aware Model Generation. - Gianmarco Mongelli; Eric Faehn; Dylan Robins; Patrick Girard 001; Arnaud Virazel (ITC, 2024)

Accelerating Cell-Aware Model Generation for Sequential Cells using Graph Theory. - Gianmarco Mongelli; Eric Faehn; Dylan Robins; Patrick Girard 001; Arnaud Virazel (DATE, 2025)

SRAM Periphery Testing Using the Cell-Aware Test Methodology. - Xhesila Xhafa; Eric Faehn; Patrick Girard 001; Arnaud Virazel (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)