A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards. - Erik Jan Marinissen; Ferenc Fodor; Bart De Wachter; Jorg Kiesewetter; Eric Hill; Ken Smith (ITC-Asia, 2017)

Deep Stalling using a Coverage Driven Genetic Algorithm Framework. - Siddhanth Dhodhi; Debarshi Chatterjee; Eric Hill; Saad Godil (VTS, 2021)

ChipNeMo: Domain-Adapted LLMs for Chip Design. - Mingjie Liu; Teodor-Dumitru Ene; Robert Kirby 001; Chris Cheng; Nathaniel Ross Pinckney; Rongjian Liang; Jonah Alben; Himyanshu Anand; Sanmitra Banerjee; Ismet Bayraktaroglu; Bonita Bhaskaran; Bryan Catanzaro; et al. (CoRR, 2023)

Insights into Vulnerability Trends in Maven Artifacts: Recurrence, Popularity, and User Behavior. - Courtney Bodily; Eric Hill; Andreas Kramer; Leslie Kerby; Minhaz F. Zibran (MSR, 2025)