The Weighted Random Test-Pattern Generator. - H. Daniel Schnurmann; Eric Lindbloom; Robert G. Carpenter (IEEE Trans. Computers, 1975)

A Heuristic Test-Pattern Generator for Programmable Logic Arrays. - Edward B. Eichelberger; Eric Lindbloom (IBM J. Res. Dev., 1980)

An LSSD Pseudo Random Pattern Test System. - Franco Motika; John A. Waicukauski; Edward B. Eichelberger; Eric Lindbloom (ITC, 1983)

Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test. - Edward B. Eichelberger; Eric Lindbloom (IBM J. Res. Dev., 1983)

A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation. - John A. Waicukauski; Eric Lindbloom; Edward B. Eichelberger; Donato O. Forlenza; Tim McCarthy (ITC, 1985)

Transition Fault Simulation by Parallel Pattern Single Fault Propagation. - John A. Waicukauski; Eric Lindbloom; Vijay S. Iyengar; Barry K. Rosen (ITC, 1986)

Transition Fault Simulation. - John A. Waicukauski; Eric Lindbloom; Barry K. Rosen; Vijay S. Iyengar (IEEE Des. Test, 1987)

Fault Detection Effectiveness of Weighted Random Patterns. - John A. Waicukauski; Eric Lindbloom (ITC, 1988)

Failure diagnosis of structured VLSI. - John A. Waicukauski; Eric Lindbloom (IEEE Des. Test, 1989)

A Method for Generating Weighted Random Test Patterns. - John A. Waicukauski; Eric Lindbloom; Edward B. Eichelberger; Orazio P. Forlenza (IBM J. Res. Dev., 1989)