Measurement of Nano-Displacement Based on In-Plane Suspended-Gate MOSFET Detection Compatible with a Front-End CMOS Process. - Éric Colinet; Cedric Durand; Patrick Audebert; Philippe Renaux; Denis Mercier; Laurent Duraffourg; Eric Ollier; Fabrice Casset; Pascal Ancey; Lionel Buchaillot; Adrian M. Ionescu (ISSCC, 2008)

Ultra-Sensitive Capacitive Detection Based on SGMOSFET Compatible With Front-End CMOS Process. - Éric Colinet; Cedric Durand; Laurent Duraffourg; Patrick Audebert; Guillaume Dumas; Fabrice Casset; Eric Ollier; Pascal Ancey; Jean-François Carpentier; Lionel Buchaillot; Adrian M. Ionescu (IEEE J. Solid State Circuits, 2009)

Towards ultra-dense arrays of VHF NEMS with FDSOI-CMOS active pixels for sensing applications. - Gregory Arndt; Cecilia Dupre; Julien Arcamone; Gerald Cibrario; Olivier Rozeau; Laurent Duraffourg; Eric Ollier; Éric Colinet (ISSCC, 2012)

Dual-gate junction-less FET-detection for in-plane nano-electro-mechanical resonators. - Faezeh Arab Hassani; Hiroshi Mizuta; Yoshishige Tsuchiya; Cecilia Dupre; Eric Ollier; Sebastian T. Bartsch; Adrian Mihai Ionescu (ICICDT, 2013)

High performance NEMS devices for sensing applications. - Thomas Ernst 005; Sebastien Hentz; Julien Arcamone; Vincent Agache; Laurent Duraffourg; Issam Ouerghi; Willy Ludurczak; Carine Ladner; Eric Ollier; Philippe Andreucci; Éric Colinet; Pierre Puget (ESSDERC, 2015)