Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. - Sergey Bychikhin; Martin Litzenberger; R. Pichler; Dionyz Pogany; Erich Gornik; Gerhard Groos; Matthias Stecher (Microelectron. Reliab., 2001)

Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices. - Martin Litzenberger; R. Pichler; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Kai Esmark; Harald Gossner (Microelectron. Reliab., 2001)

Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions. - M. Blaho; Dionyz Pogany; L. Zullino; A. Andreini; Erich Gornik (Microelectron. Reliab., 2002)

Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique. - Dionyz Pogany; Ján Kuzmík; J. Darmo; Martin Litzenberger; Sergey Bychikhin; Karl Unterrainer; Z. Mozolova; S. Hascik; Tibor Lalinsky; Erich Gornik (Microelectron. Reliab., 2002)

Device Simulation and Backside Laser Interferometry–Powerful Tools for ESD Protection Development. - Wolfgang Stadler; Kai Esmark; Harald Gossner; Martin Streibl; M. Wendel; Wolfgang Fichtner; Dionyz Pogany; Martin Litzenberger; Erich Gornik (Microelectron. Reliab., 2002)

Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. - M. Blaho; Dionyz Pogany; Erich Gornik; Marie Denison; Gerhard Groos; Matthias Stecher (Microelectron. Reliab., 2003)

A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Dionyz Pogany; Erich Gornik; J. Willemen; Ning Qu; Wolfgang Wilkening; L. Zullino; A. Andreini (Microelectron. Reliab., 2003)

Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress. - Sergey Bychikhin; Viktor Dubec; Dionyz Pogany; Erich Gornik; M. Graf; V. Dudek; Winfried Soppa (Microelectron. Reliab., 2004)

Multiple-time-instant 2D thermal mapping during a single ESD event. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Michael Heer; Dionyz Pogany; Marie Denison; Nils Jensen; Matthias Stecher; Gerhard Groos; Erich Gornik (Microelectron. Reliab., 2004)

Automated setup for thermal imaging and electrical degradation study of power DMOS devices. - Michael Heer; Viktor Dubec; M. Blaho; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Marie Denison; Matthias Stecher; Gerhard Groos (Microelectron. Reliab., 2005)

Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices. - Martin Litzenberger; Christoph Furböck; Sergey Bychikhin; Dionyz Pogany; Erich Gornik (IEEE Trans. Instrum. Meas., 2005)

Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up. - Michael Heer; Viktor Dubec; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; M. Frank; A. Konrad; J. Schulz (Microelectron. Reliab., 2006)

Backside interferometric methods for localization of ESD-induced leakage current and metal shorts. - Viktor Dubec; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Tilo Brodbeck; Wolfgang Stadler (Microelectron. Reliab., 2007)

Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. - Georg Haberfehlner; Sergey Bychikhin; Viktor Dubec; Michael Heer; A. Podgaynaya; M. Pfost; Matthias Stecher; Erich Gornik; Dionyz Pogany (Microelectron. Reliab., 2009)

Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. - Michael Heer; Krzysztof Domanski; Kai Esmark; Ulrich Glaser; Dionyz Pogany; Erich Gornik; Wolfgang Stadler (Microelectron. Reliab., 2009)

Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. - A. Podgaynaya; Ralf Rudolf; B. Elattari; Dionyz Pogany; Erich Gornik; Matthias Stecher; Marc Strasser (Microelectron. Reliab., 2010)

Application of transient interferometric mapping method for ESD and latch-up analysis. - Dionyz Pogany; Sergey Bychikhin; Michael Heer; W. Mamanee; Erich Gornik (Microelectron. Reliab., 2011)