High temperature degradation of palladium coated copper bond wires. - Jörg C. Krinke; Dragica Dragicevic; Susann Leinert; Erik Frieß; Joachim Glück (Microelectron. Reliab., 2014)

Static logic state analysis by TLS on powered logic circuits: Three case studies for suspected stuck-at failure modes. - Clemens Helfmeier; Erik Frieß; Joachim Glück (Microelectron. Reliab., 2016)