Tackling test trade-offs from design, manufacturing to market using economic modeling. - Erik H. Volkerink; Ajay Khoche; Linda A. Kamas; Jochen Rivoir; Hans G. Kerkhoff (ITC, 2001)

Packet-Based Input Test Data Compression Techniques. - Erik H. Volkerink; Ajay Khoche; Subhasish Mitra (ITC, 2002)

Test Vector Compression Using EDA-ATE Synergies. - Ajay Khoche; Erik H. Volkerink; Jochen Rivoir; Subhasish Mitra (VTS, 2002)

Test Economics for Multi-site Test with Modern Cost Reduction Techniques. - Erik H. Volkerink; Ajay Khoche; Jochen Rivoir; Klaus-Dieter Hilliges (VTS, 2002)

ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. - Harald P. E. Vranken; Friedrich Hapke; Soenke Rogge; Domenico Chindamo; Erik H. Volkerink (ITC, 2003)

Efficient Seed Utilization for Reseeding based Compression. - Erik H. Volkerink; Subhasish Mitra (VTS, 2003)

Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. - Erik H. Volkerink; Ajay Khoche; Jochen Rivoir; Klaus-Dieter Hilliges (J. Electron. Test., 2003)

Speed Clustering of Integrated Circuits. - Kenneth A. Brand; Erik H. Volkerink; Edward J. McCluskey; Subhasish Mitra (ITC, 2004)

ELF-Murphy Data on Defects and Test Sets. - Edward J. McCluskey; Ahmad A. Al-Yamani; Chien-Mo James Li; Chao-Wen Tseng; Erik H. Volkerink; François-Fabien Ferhani; Edward Li; Subhasish Mitra (VTS, 2004)

Delay Defect Screening using Process Monitor Structures. - Subhasish Mitra; Erik H. Volkerink; Edward J. McCluskey; Stefan Eichenberger (VTS, 2004)

Response compaction with any number of unknowns using a new LFSR architecture. - Erik H. Volkerink; Subhasish Mitra (DAC, 2005)

Empirical Validation of Yield Recovery Using Idle-Cycle Insertion. - Donghwi Lee; Erik H. Volkerink; Intaik Park; Jeff Rearick (IEEE Des. Test Comput., 2007)

The ABCs of ITC. - Ron Press; Erik H. Volkerink (IEEE Des. Test Comput., 2010)