Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. - Erkan Acar; Sule Ozev (ITC, 2004)

Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. - Erkan Acar; Sule Ozev (ICCAD, 2005)

Defect-based RF testing using a new catastrophic fault model. - Erkan Acar; Sule Ozev (ITC, 2005)

Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements. - Erkan Acar; Sule Ozev (VTS, 2005)

Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers. - Erkan Acar; Sule Ozev; Kevin B. Redmond (ICCAD, 2006)

Efficient Testing of RF MIMO Transceivers Used in WLAN Applications. - Erkan Acar; Sule Ozev (ICCD, 2006)

Digital calibration of RF transceivers for I-Q imbalances and nonlinearity. - Erkan Acar; Sule Ozev (ICCD, 2007)

Low cost characterization of RF transceivers through IQ data analysis. - Erkan Acar; Sule Ozev (ITC, 2007)

Test yield estimation for analog/RF circuits over multiple correlated measurements. - Fang Liu 029; Erkan Acar; Sule Ozev (ITC, 2007)

A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up. - Erkan Acar; Sule Ozev; Kevin B. Redmond (VTS, 2007)

Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup. - Erkan Acar; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2007)

Optimized EVM Testing for IEEE 802.11a/n RF ICs. - Erkan Acar; Sule Ozev; Ganesh Srinivasan; Friedrich Taenzler (ITC, 2008)

Defect-Oriented Testing of RF Circuits. - Erkan Acar; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Defect Filter for Alternate RF Test. - Haralampos-G. D. Stratigopoulos; Salvador Mir; Erkan Acar; Sule Ozev (ETS, 2009)

Built-in EVM measurement for OFDM transceivers using all-digital DFT. - Ender Yilmaz; Afsaneh Nassery; Sule Ozev; Erkan Acar (ITC, 2009)

Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis. - Erkan Acar; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

Low Cost MIMO Testing for RF Integrated Circuits. - Erkan Acar; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2010)