Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. - Damien Leroy; Rémi Gaillard; Erwin Schäfer; Cyrille Beltrando; Shi-Jie Wen; Richard Wong (IOLTS, 2008)

Highs and lows of radiation testing. - Dan Alexandrescu; Anne-Lise Lhomme-Perrot; Erwin Schäfer; Cyrille Beltrando (IOLTS, 2009)