An integrated design for testability and automatic test pattern generation system: An overview. - Erwin Trischler (DAC, 1984)

ATWIG, An Automatic Test Pattern Generator with Inherent Guidance. - Erwin Trischler (ITC, 1984)

Guided Inconsistent Path Sensitization: Method And Experimental Results. - Erwin Trischler (ITC, 1985)

SOCRATES: a highly efficient automatic test pattern generation system. - Michael H. Schulz; Erwin Trischler; Thomas M. Sarfert (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

Hierarchical Test Pattern Generation Based on High-Level Primitives. - Thomas M. Sarfert; Remo G. Markgraf; Erwin Trischler; Michael H. Schulz (ITC, 1989)

Zur Modellierung digitaler Schaltungen mit AND/OR-Graphen für die automatische Testmustergenerierung. - Erwin Trischler (1989)

A hierarchical test pattern generation system based on high-level primitives. - Thomas M. Sarfert; Remo G. Markgraf; Michael H. Schulz; Erwin Trischler (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

Ten: A Concurrent Test Engineering Environment. - Erwin Trischler; Mats Johansson (IEEE Des. Test Comput., 1994)

Sensitivity analysis in economics based test strategy planning. - J. H. Dick; Erwin Trischler; Chryssa Dislis; Anthony P. Ambler (J. Electron. Test., 1994)

Efficient sensitization of multi-bit-paths for testing embedded modules in synchronous sequential circuits. - Konstantin Keutner; Erwin Trischler (J. Electron. Test., 1995)