Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS. - Mohamed H. Abu-Rahma; Ying Chen; Wing Sy; Wee Ling Ong; Leon Yeow Ting; Sei Seung Yoon; Michael Han 002; Esin Terzioglu (CICC, 2011)

Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology. - Animesh Datta; Mohamed H. Abu-Rahma; Sachin Dileep Dasnurkar; Hadi Rasouli; Sean Tamjidi; Ming Cai; Samit Sengupta; P. R. Chidambaram; Raghavan Thirumala; Nikhil Kulkarni; Prasanna Seeram; Prasad Bhadri; et al. (ISQED, 2013)

Experiments and analysis to characterize logic state retention limitations in 28nm process node. - Sachin Dileep Dasnurkar; Animesh Datta; Mohamed H. Abu-Rahma; Hieu Nguyen; Martin Villafana; Hadi Rasouli; Sean Tamjidi; Ming Cai; Samit Sengupta; P. R. Chidambaram; Raghavan Thirumala; Nikhil Kulkarni; et al. (VTS, 2013)