Scalable BIST for Linearity Testing of Sigma-Delta Modulators. - Krishna Pramod Madabhushi; Trevor LaBanz; Sudip Dandnaik; Eslam Hag (ITC, 2024)

Accelerating Analog Test through Firmware-Hardware Driven Parallelism. - Krishna Pramod Madabhushi; Ayush Jain; Logan Pukett; William Jahner; Eslam Hag (VTS, 2026)