Challenges for High Volume Testing of Embedded IO Interfaces in Disaggregated Microprocessor Products. - Esteban Garita-Rodríguez; Renato Rimolo-Donadio; Rafael Zamora-Salazar (ITC, 2022)

Test, Debug, and Repair for Chiplet-Based Designs. - Anshuman Chandra; Esteban Garita-Rodríguez; Pradipta Ghosh (VTS, 2025)