Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection. - David Lin; Ted Hong; Yanjing Li; Eswaran S; Sharad Kumar; Farzan Fallah; Nagib Hakim; Donald S. Gardner; Subhasish Mitra (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

Quick error detection tests with fast runtimes for effective post-silicon validation and debug. - David Lin; Eswaran S; Sharad Kumar; Eric Rentschler; Subhasish Mitra (DATE, 2015)