Single-event-upset and alpha-particle emission rate measurement techniques. - Michael S. Gordon; Kenneth P. Rodbell; David F. Heidel; Cyril Cabral Jr.; Ethan H. Cannon; Daniel D. Reinhardt (IBM J. Res. Dev., 2008)

Alpha-particle-induced upsets in advanced CMOS circuits and technology. - David F. Heidel; Kenneth P. Rodbell; Ethan H. Cannon; Cyril Cabral Jr.; Michael S. Gordon; Phil Oldiges; Henry H. K. Tang (IBM J. Res. Dev., 2008)

Circuit design and modeling for soft errors. - A. J. KleinOsowski; Ethan H. Cannon; Phil Oldiges; Larry Wissel (IBM J. Res. Dev., 2008)

Phaser: Phased methodology for modeling the system-level effects of soft errors. - Jude A. Rivers; Pradip Bose; Prabhakar Kudva; John-David Wellman; Pia N. Sanda; Ethan H. Cannon; Luiz C. Alves (IBM J. Res. Dev., 2008)

POWER7TM local clocking and clocked storage elements. - James D. Warnock; Leon J. Sigal; Dieter F. Wendel; K. Paul Muller; Joshua Friedrich; Victor V. Zyuban; Ethan H. Cannon; A. J. KleinOsowski (ISSCC, 2010)

Resiliency challenges in sub-10nm technologies. - Rob Aitken; Ethan H. Cannon; Mondira Pant; Mehdi Baradaran Tahoori (VTS, 2015)

Compact modeling and simulation of accelerated circuit aging. - Devyani Patra; Jiayang Zhang; Runsheng Wang; Mehdi Katoozi; Ethan H. Cannon; Ru Huang 001; Yu Cao 001 (CICC, 2018)

Accelerated BTI degradation under stochastic TDDB effect. - Devyani Patra; Ahmed Kamal Reza; Mehdi Katoozi; Ethan H. Cannon; Kaushik Roy 001; Yu Cao 001 (IRPS, 2018)

Adaptive accelerated aging for 28 nm HKMG technology. - Devyani Patra; Ahmed Kamal Reza; Mohammad Khaled Hassan; Mehdi Katoozi; Ethan H. Cannon; Kaushik Roy 001; Yu Cao 001 (Microelectron. Reliab., 2018)