Adapting an industrial memory BIST solution for testing CAMs. - Jais Abraham; Uttam Garg; Glenn Colón-Bonet; Ramesh Sharma; Chennian Di; Benoit Nadeau-Dostie; Etienne Racine; Martin Keim (ITC-Asia, 2017)

Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. - Jaehoon Lee; Hyeonuk Son; Seohyun Kang; Dahyun Kang; Dongkwan Han; Jongsin Yun; Artur Pogiel; Etienne Racine; Krzysztof Jurga; Lori Schramm; Martin Keim (ITC, 2024)