A 12-bit 8GS/s RF Sampling DAC with Code-Dependent Nonlinearity Compensation and Intersegmental Current-Mismatch Calibration in 5nm FinFET. - Byeongwoo Koo; Sunghan Do; Sang-Pil Nam; Heewook Shin; Sungno Lee; Eunhye Oh; Jaemin Hong; Jung-Ho Lee; Youngjae Cho; Michael Choi; Jongshin Shin (VLSI Technology and Circuits, 2022)

An Automotive ASIL-D Safety Mechanism in ADC and DAC for Communication Application. - Kyung-Hoon Lee; Jinwoo Park; Younghyo Park; Byeongwoo Koo; Sunghan Do; Woongtaek Lim; Sungno Lee; Hyochul Shin; Eunhye Oh; Youngjae Cho; Michael Choi; Jongshin Shin (VLSI Technology and Circuits, 2022)

An Efficient Vth-Tilting PUF Design in 3nm GAA and 8nm FinFET Technologies. - Bohdan Karpinskyy; Yong Ki Lee; Sumin Noh; Yunhyeok Choi; Jieun Park; Jisu Kang; Taewook Park; Eunhye Oh; Gapkyung Kim; Sungha Lee; Hyunwoo Ko; Jonghoon Shin; et al. (ISSCC, 2025)