Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism. - Jongwoo Park 001; Miji Lee; Hanbyul Kang; Wooram Ko; Eunkyeong Choi; Junsik Im; Minwoo Lee; Dohwan Chung; Jinchul Park; Sangchul Shin; Sangwoo Pae (IRPS, 2015)

Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI. - Younggeun Ji; Jeonghoon Kim; Jungin Kim; Miji Lee; Jaeheon Noh; Taeyoung Jeong; Juhyeon Shin; Junho Kim; Young Heo; Ung Cho; Hyun-Chul Sagong; Junekyun Park; et al. (IRPS, 2018)