Vertical and lateral charge losses during short time retention in 3-D NAND flash memory. - Yongwoo Lee; Jinsu Yoon; Kwangmin Lim; Bongsik Choi; Geon-Hwi Park; Ju Won Jeon; Jong-Ho Bae; Dong Myong Kim; Dae Hwan Kim; Eunmee Kwon; Sung-Jin Choi (ESSDERC, 2021)