The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory. - Evaldo Carlos Fonseca Pereira; Odair Lelis Goncalez; Rafael Galhardo Vaz; Claudio Antonio Federico; Thiago Hanna Both; Gilson Inácio Wirth (LATW, 2014)

Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects. - Lucas A. Tambara; Jorge L. Tonfat; Ricardo Reis 001; Fernanda Lima Kastensmidt; Evaldo Carlos Fonseca Pereira; Rafael Galhardo Vaz; Odair Lelis Goncalez (LATW, 2014)