A color vision system for microelectronics: Application to oxide thickness measurements. - Matt Barth; Srinivasan Parthasarathy 001; Jing Wang 072; Evelyn Hu; Susan Hackwood; Gerardo Beni (ICRA, 1986)

Inference in intelligent machines: Application to a thermal evaporator. - Evelyn Hu; S. Mangiaracina; M. Peters; A. Harkin; Susan Hackwood; Gerardo Beni (ICRA, 1986)

A color vision system for film thickness determination. - Srinivasan Parthasarathy 001; Denise Wolf; Evelyn Hu; Susan Hackwood; Gerardo Beni (ICRA, 1987)