Growth and characterization of ultrathin nitrided silicon oxide films. - Evgeni P. Gusev; Hsu-Chang Lu; Eric L. Garfunkel; Torgny Gustafsson; Martin L. Green (IBM J. Res. Dev., 1999)

Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. - J. A. Felix; J. R. Schwank; Daniel M. Fleetwood; M. R. Shaneyfelt; Evgeni P. Gusev (Microelectron. Reliab., 2004)

Reverse short channel effects in high-k gated nMOSFETs. - Jin-Ping Han; Sang-Mo Koo; Eric M. Vogel; Evgeni P. Gusev; C. D'Emic; Curt A. Richter; John S. Suehle (Microelectron. Reliab., 2005)

Advanced high-k dielectric stacks with polySi and metal gates: Recent progress and current challenges. - Evgeni P. Gusev; Vijay Narayanan; Martin M. Frank (IBM J. Res. Dev., 2006)

Germanium channel MOSFETs: Opportunities and challenges. - Huiling Shang; Martin M. Frank; Evgeni P. Gusev; Jack O. Chu; Stephen W. Bedell; Kathryn W. Guarini; Mei-Kei Ieong (IBM J. Res. Dev., 2006)

Mirasol® - MEMS-based Direct View Reflective Display Technology. - Ion Bita; Alok Govil; Evgeni P. Gusev (Handbook of Visual Display Technology, 2012)