Models of Printed Circuit Boards Conductive Pattern Defects. - Evgeniya Danilova; Igor I. Kochegarov; Nikolay K. Yurkov; Mikhail Miheev; Normunds Kante (Appl. Comput. Syst., 2018)

Modelling of Measurement Error for Vibrational Displacement Based on the Blurring Analysis of a Round Mark Image. - Alexey Grigoriev; Evgeniya Danilova; Vasiliy A. Trusov; Michail Miheev; Marina Uhanova (Appl. Comput. Syst., 2018)