Predicting future technology performance. - Asen Asenov; Craig Alexander; Craig Riddet; Ewan Towie (DAC, 2013)

Comparison of Si < 100 > and < 110 > crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations. - Louis Gerrer; Vihar P. Georgiev; Salvatore M. Amoroso; Ewan Towie; A. Asenov (Microelectron. Reliab., 2015)