True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines. - Graziella Scandurra; Carmine Ciofi; Calogero Pace; F. Speroni; F. Alagi (Microelectron. Reliab., 2002)

DMOS FET parameter drift kinetics from microscopic modeling. - F. Alagi (Microelectron. Reliab., 2010)

A first-order kinetics ageing model for the hot-carrier stress of high-voltage MOSFETs. - F. Alagi (Microelectron. Reliab., 2011)

Hot-carrier-induced time dependent dielectric breakdown in high voltage pMOSFETs. - F. Alagi (Microelectron. Reliab., 2011)