Modeling the variation of threshold voltage, mobility factor and saturation coefficient in amorphous Indium-Gallium-Zinc Oxide thin film transistors. - Y. Hernandez-Barrios; F. Avila-Herrera; Magali Estrada; Antonio Cerdeira; Oana Moldovan; Benjamín Iñíguez; Rodrigo Picos (CCE, 2016)

Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors. - Magali Estrada; M. Rivas; Ivan Garduño; F. Avila-Herrera; Antonio Cerdeira; Marcelo Antonio Pavanello; Israel Mejia; M. A. Quevedo-Lopez (Microelectron. Reliab., 2016)

Drain current model for short-channel triple gate junctionless nanowire transistors. - Bruna Cardoso Paz; Mikaël Cassé; Sylvain Barraud; Gilles Reimbold; Olivier Faynot; F. Avila-Herrera; Antonio Cerdeira; Marcelo Antonio Pavanello (Microelectron. Reliab., 2016)