Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach. - F. Baccar; Stephane Azzopardi; L. Théolier; K. El Boubkari; Jean-Yves Delétage; Eric Woirgard (Microelectron. Reliab., 2013)

Mechanical stress investigation after technological process in Deep Trench Termination DT2 using BenzoCycloButene as dielectric material. - Houssam Arbess; F. Baccar; L. Théolier; Stephane Azzopardi; Eric Woirgard (Microelectron. Reliab., 2015)

Ageing mechanisms in Deep Trench Termination (DT2) Diode. - F. Baccar; Houssam Arbess; L. Théolier; Stephane Azzopardi; Eric Woirgard (Microelectron. Reliab., 2015)