CADless laser assisted methodologies for failure analysis and device reliability. - A. Deyine; Kevin Sanchez; Philippe Perdu; F. Battistella; Dean Lewis (Microelectron. Reliab., 2010)

A challenging case study resolved by using the Dynamic Laser Stimulation technique. - Amjad Deyine; Emmanuel Doche; F. Battistella; Christophe Banc (Microelectron. Reliab., 2012)