Fast CV MSM Technique for Comprehensive Analysis of Bulk Trapping in Low-K Carbon-Doped Dielectrics. - Tadeu Mota Frutuoso; William Vandendaele; A. Bond; F. Bringuier; V. Lapras; Marie Claire Cyrille; Claire Fenouillet-Béranger; B. Duriez; Xavier Garros (IRPS, 2025)