Analog test bus architecture for small die size and limited pin count devices with internal IPs testability emphasis. - Eduardo Ribeiro da Silva; F. Costa; Frank Herman Behrens; Remerson Stein Kickhofel; Ricardo Maltione (LATW, 2009)

Using mixed-mode test bus architecture to RF-based fault injection analysis and EMC fault debug. - Eduardo Ribeiro da Silva; F. Costa; Frank Herman Behrens; Remerson Stein Kickhofel; Ricardo Maltione (LATW, 2009)