Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks. - F. Darlay; Bernard Courtois (EURO-DAC, 1990)

Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors. - Mohamed Soufi; Yvon Savaria; F. Darlay; Bozena Kaminska (IEEE Trans. Computers, 1995)